4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Temperature measuring system

Yoshihiko Satsukawa

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Flip-flop circuit having majority-logic circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
Reexamination Certificate

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Logic circuit including a plurality of master-slave...

Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate

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Temperature adaptive circuit, circuit temperature raising...

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate

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Timing failure remedying apparatus for an integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Profile ID: LFUS-PAI-P-2968028

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