Programmable memory built-in-self-test (MBIST) method and...

Details Programmable memory built-in-self-test (MBIST) method and... Programmable memory built-in-self-test (MBIST) method and...

2005-11-18

2008-09-23

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000

Reexamination Certificate

active

07428680

ABSTRACT:
Programmable memory built-in self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.

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