Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-12-26
2006-12-26
Ton, David (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S732000
Reexamination Certificate
active
07155652
ABSTRACT:
A system and method for processing tester information is provided having a system-under-test. A pattern is written to the system-under-test, and a pattern is read therefrom. The pattern written is then compared to the pattern read from the system-under-test. The signal from the comparison is processed, and the signal from the signal processing is then analyzed.
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Advanced Micro Devices , Inc.
Ishimaru Mikio
Ton David
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