4. Data processing: measuring, calibrating, or testing
  5. Testing system

Shivananda S. Shetty

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Characterizing distribution signatures in integrated circuit...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Determination of nonphotolithographic wafer process-splits...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Digital signal processing for real time classification of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Efficient storage of fail data to aid in fault isolation

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method and apparatus for correlating semiconductor process...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2718314

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