4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Byong-Kwon Lee

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Apparatus for controlling input termination of semiconductor...

Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate

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Methods and devices for accessing a memory using multiple...

Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition
Reexamination Certificate

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Semiconductor integrated circuit device with test element...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Semiconductor integrated circuit device with test element...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Test circuits of semiconductor memory device for multi-chip...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2341062

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