Systems and methods for testing performance of an electronic...

Details Systems and methods for testing performance of an electronic... Systems and methods for testing performance of an electronic...

2006-08-29

2006-08-29

Lamarre, Guy (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000

Reexamination Certificate

active

07100098

ABSTRACT:
A method for testing performance of a device-under-test (DUT) includes: examining vectors, each of the vectors including a plurality of characters; and creating waveform entries, each of the waveform entries corresponding to a distinct vector configuration encountered among the vectors examined.

REFERENCES:
patent: 4775977 (1988-10-01), Dehara
patent: 5142223 (1992-08-01), Higashino et al.
patent: 5293080 (1994-03-01), Hiwada et al.
patent: 5453995 (1995-09-01), Behrens
patent: 5930271 (1999-07-01), Takahashi
patent: 6412087 (2002-06-01), Matsumoto
patent: 6484282 (2002-11-01), Tsuto
patent: 6769083 (2004-07-01), Tsuto et al.
patent: 2003/0110427 (2003-06-01), Rajsuman et al.

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