System-on-chip performing multi-phase scan chain and method...

Details System-on-chip performing multi-phase scan chain and method... System-on-chip performing multi-phase scan chain and method...

2011-03-29

2011-03-29

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000, C714S724000, C714S731000, C714S726000, C714S727000

Reexamination Certificate

active

07917821

ABSTRACT:
A system on chip (SOC) may include function blocks, and a scan chain in each of the function blocks, the scan chains being adapted to conduct scan test operations in sync with a respective one of a plurality of clock signals having a different phase relative to each other, wherein during an isolation mode, the scan chains test combination circuits of the function blocks, and during an interface mode, the scan chains of adjacent ones of the function blocks test combination circuits between the adjacent ones of the function blocks.

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