4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Donald Gabrielson

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Method and apparatus for automatically configuring and/or...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Method for abstraction of manufacturing test access and...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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System for performing automatic test pin assignment for a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Profile ID: LFUS-PAI-P-2807850

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