Silicon substrate with reduced surface roughness

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Dopant introduction into semiconductor region

Reexamination Certificate

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C257SE21135

Reexamination Certificate

active

07863067

ABSTRACT:
The present disclosure provides a method for fabricating a semiconductor device including providing a semiconductor substrate comprising a first surface and a second surface, wherein at least one imaging sensor is located adjacent the first surface, activating a dopant layer in the semiconductor substrate adjacent the second surface using a localized annealing process, and etching the dopant layer.

REFERENCES:
patent: 5688715 (1997-11-01), Sexton et al.
patent: 6924163 (2005-08-01), Okazaki et al.
patent: 7095050 (2006-08-01), Wanlass et al.
patent: 2006/0076590 (2006-04-01), Pain et al.

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