Semiconductor integrated circuit and test system for testing...

Details Semiconductor integrated circuit and test system for testing... Semiconductor integrated circuit and test system for testing...

2007-05-22

2007-05-22

Lamarre, Guy (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000

Reexamination Certificate

active

10426663

ABSTRACT:
A semiconductor integrated circuit includes a pin section, internal circuits, an interface section, an expectation value generation circuit, a comparison circuit and a waveform generation circuit. In a first test mode, the expectation value generation circuit generates expectation values of operation signals to be generated by the interface section when first test signals having the same waveform are input via respective pins of the pin section, and the comparison circuit compares operation signals that are actually produced by the interface section with the respective expectation values and produces comparison results. In a second test mode, the waveform generation circuit supplies second test signals to the interface section, and the interface section outputs test output signals having the same waveform to the external system via respective pins of the pin section.

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