4. Static information storage and retrieval
  5. Read/write circuit
  6. Having particular data buffer or latch

Masaaki Tanimura

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Apparatus and method of inspecting semiconductor integrated...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor inspecting system for inspecting a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor integrated circuit and method for testing the...

Semiconductor device manufacturing: process – Making passive device – Resistor
Reexamination Certificate

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Semiconductor integrated circuit and test system for testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor memory device having a test mode and...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1395770

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