Semiconductor device and test system thereof

Details Semiconductor device and test system thereof Semiconductor device and test system thereof

2006-08-07

2009-06-02

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S731000

Reexamination Certificate

active

07543210

ABSTRACT:
A semiconductor device that includes a clock buffer, which generates an internal clock signal in response to a clock signal and a complementary clock signal if the semiconductor device is operating in a first mode and generates the internal clock signal in response to the clock signal and a reference voltage if the semiconductor device is operating in a second mode.

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Office Action for corresponding Korean Office Action No. 10-2005-0074493 dated Oct. 23, 2007.

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