Remote plasma activated nitridation

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate

Reexamination Certificate

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C438S771000, C438S775000, C257SE21267

Reexamination Certificate

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07629270

ABSTRACT:
A nitrogen precursor that has been activated by exposure to a remotely excited species is used as a reactant to form nitrogen-containing layers. The remotely excited species can be, e.g., N2, Ar, and/or He, which has been excited in a microwave radical generator. Downstream of the microwave radical generator and upstream of the substrate, the flow of excited species is mixed with a flow of NH3. The excited species activates the NH3. The substrate is exposed to both the activated NH3and the excited species. The substrate can also be exposed to a precursor of another species to form a compound layer in a chemical vapor deposition. In addition, already-deposited layers can be nitrided by exposure to the activated NH3and to the excited species, which results in higher levels of nitrogen incorporation than plasma nitridation using excited N2alone, or thermal nitridation using NH3alone, with the same process temperatures and nitridation durations.

REFERENCES:
patent: 4363828 (1982-12-01), Brodsky et al.
patent: 4495218 (1985-01-01), Azuma et al.
patent: 4585671 (1986-04-01), Kitagawa et al.
patent: 4684542 (1987-08-01), Jasinski et al.
patent: 5214002 (1993-05-01), Hayashi et al.
patent: 5227329 (1993-07-01), Kobayashi et al.
patent: 5356673 (1994-10-01), Schmitt et al.
patent: 5356821 (1994-10-01), Naruse et al.
patent: 5389398 (1995-02-01), Suzuki et al.
patent: 5389570 (1995-02-01), Shiozawa
patent: 5453858 (1995-09-01), Yamazaki
patent: 5471330 (1995-11-01), Sarma
patent: 5591494 (1997-01-01), Sato et al.
patent: 5607724 (1997-03-01), Beinglass et al.
patent: 5614257 (1997-03-01), Beinglass et al.
patent: 5648293 (1997-07-01), Hayama et al.
patent: 5656531 (1997-08-01), Thakur et al.
patent: 5695819 (1997-12-01), Beinglass et al.
patent: 5698771 (1997-12-01), Shields et al.
patent: 5700520 (1997-12-01), Beinglass et al.
patent: 5786027 (1998-07-01), Rolfson
patent: 5789030 (1998-08-01), Rolfson
patent: 5837580 (1998-11-01), Thakur et al.
patent: 5849601 (1998-12-01), Yamazaki
patent: 5874129 (1999-02-01), Beinglass et al.
patent: 5876797 (1999-03-01), Beinglass et al.
patent: 5885869 (1999-03-01), Turner et al.
patent: 5959326 (1999-09-01), Aiso et al.
patent: 6027705 (2000-02-01), Kitsuno et al.
patent: 6083810 (2000-07-01), Obeng et al.
patent: 6103600 (2000-08-01), Ueda et al.
patent: 6159828 (2000-12-01), Ping et al.
patent: 6161498 (2000-12-01), Toraguchi et al.
patent: 6171662 (2001-01-01), Nakao
patent: 6197669 (2001-03-01), Twu et al.
patent: 6197694 (2001-03-01), Beinglass
patent: 6228181 (2001-05-01), Yamamoto et al.
patent: 6326311 (2001-12-01), Ueda et al.
patent: 6385020 (2002-05-01), Shin et al.
patent: 6455892 (2002-09-01), Okuno et al.
patent: 6518203 (2003-02-01), Narwankar et al.
patent: 6613695 (2003-09-01), Pomarede et al.
patent: 6809370 (2004-10-01), Colombo et al.
patent: 6821825 (2004-11-01), Todd et al.
patent: 6962859 (2005-11-01), Todd et al.
patent: 2002/0098627 (2002-07-01), Pomarede et al.
patent: 2005/0079692 (2005-04-01), Samoilov et al.
patent: 2005/0118837 (2005-06-01), Todd et al.
patent: 0368651 (1990-05-01), None
patent: 0486047 (1992-05-01), None
patent: 0747974 (1996-12-01), None
patent: 1065728 (2001-01-01), None
patent: 2332564 (1999-06-01), None
patent: 59078919 (1982-01-01), None
patent: 57209810 (1982-12-01), None
patent: 59078918 (1984-05-01), None
patent: 60043485 (1985-03-01), None
patent: S60-43485 (1985-03-01), None
patent: 61153277 (1986-07-01), None
patent: 62076612 (1987-04-01), None
patent: 63003414 (1988-01-01), None
patent: 63003463 (1988-01-01), None
patent: 01217956 (1989-08-01), None
patent: 01268064 (1989-10-01), None
patent: 02155225 (1990-06-01), None
patent: H 02-155225 (1990-06-01), None
patent: 03091239 (1991-04-01), None
patent: H3-91239 (1991-04-01), None
patent: 03185817 (1991-08-01), None
patent: 03187215 (1991-08-01), None
patent: H3-185817 (1991-08-01), None
patent: H3-187215 (1991-08-01), None
patent: 03292741 (1991-12-01), None
patent: 04323834 (1992-11-01), None
patent: 05021378 (1993-01-01), None
patent: 05062911 (1993-03-01), None
patent: H5-62911 (1993-03-01), None
patent: 07249618 (1995-09-01), None
patent: 08242006 (1996-09-01), None
patent: 11317530 (1999-11-01), None
patent: WO 02/064853 (2002-08-01), None
patent: WO 2004/009861 (2004-01-01), None
Kim et al. (Microwave Plasma Chemical Vapor Deposition of Silicon Nitride Films, Journal of the Korean Physical Society, vol. 22, No. 2, Jun. 1889).
Ikoma et al., Growth of Si/3C-SiC/Si(100) hetrostructures by pulsed supersonic free jets, Applied Physics Letters, vol. 75, No. 25, pp. 3977-3979, Dec. 1999.
Olivares, J. et al., “Solid-phase crystallization of amorphous SiGe films deposed by LPCVD on SiOs and glass,” Thin Solid Films 337 (1999), pp. 51-54.
International Search Report dated Nov. 13, 2003 for international patent application No. PCTUS02/02921, filed on Feb. 1, 2002.

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