Particle beam assisted modification of thin film materials

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Reexamination Certificate

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C257SE21331

Reexamination Certificate

active

08003498

ABSTRACT:
Several examples of a method for processing a substrate are disclosed. In a particular embodiment, the method may include: introducing a plurality of first particles to a first region of the substrate so as to form at least one crystal having a grain boundary in the first region without forming another crystal in a second region, the second region adjacent to the first region; and extending the grain boundary of the at least one crystal formed in the first region to the second region after stopping the introducing the plurality of first particles.

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Spinella, Corrado, et al., “Crystal Grain Nucleation in Amorphous Silicon”, Journal of Applied Physics, vol. 84, No. 10, Applied Physics Reviews, Nov. 15, 1998, pp. 5383-5414.

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