Operation analyzing method for semiconductor integrated...

Details Operation analyzing method for semiconductor integrated... Operation analyzing method for semiconductor integrated...

2007-05-29

2007-05-29

Do, Thuan (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

10863231

ABSTRACT:
There are contained the step of forming voltage waveform information by calculating a voltage waveform of each instance of a semiconductor integrated circuit at a power-supply terminal based on circuit information and analyzing the voltage waveform of each instance, the step of forming voltage abstraction information by abstracting the voltage waveform information, and the step of calculating a delay value of the instance based on the voltage abstraction information.

REFERENCES:
patent: 6519748 (2003-02-01), Sakamoto
patent: 6564357 (2003-05-01), Kay et al.
patent: 2002/0174409 (2002-11-01), Cohn et al.
patent: 7-239865 (1995-09-01), None
patent: 10-143553 (1998-05-01), None
patent: 2000-194732 (2000-07-01), None
patent: 2000-195960 (2000-07-01), None
Japanese Office Action issued in corresponding Japanese Patent Application No. 2003-164036, mailed Mar. 7, 2007.

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