Nobufusa Iwanishi

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Apparatus and method for calculating temporal deterioration...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Timing
Reexamination Certificate

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Delay calculating method in semiconductor integrated circuit

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Delay library representation method, delay library...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Hot carrier effect simulation for integrated circuits

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Timing
Reexamination Certificate

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Method and apparatus for designing semiconductor integrated...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-335623

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