Method of forming fine patterns

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface

Reexamination Certificate

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C430S313000, C430S315000, C430S322000, C430S330000, C427S271000, C427S372200, C427S384000, C427S385500, C438S760000

Reexamination Certificate

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10602883

ABSTRACT:
It is disclosed a method of forming fine patterns comprising: covering a substrate having photoresist patterns with an over-coating agent for forming fine patterns, removing the unwanted over-coating agent that has been deposited on the edge portions and/or the back side of the substrate, applying heat treatment to cause thermal shrinkage of the over-coating agent so that the spacing between adjacent photoresist patterns is lessened by the resulting thermal shrinking action, and removing the over-coating agent substantially completely. The invention provides a method of forming fine patterns which has high ability to control pattern dimensions and provide fine patterns that have a satisfactory profile and satisfy the characteristics required of semiconductor devices, with an additional capability of preventing the occurrence of particles which are a potential cause of device contamination.

REFERENCES:
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“Extended Abstracts”, (The 42ndSpring Meeting, 1995);The Japan Society of Applied Physics and Related Societies,No. 2.
“Extended Abstracts”, (The 55thAutumn Meeting, 1994);The Japan Society of Applied Physics,No. 2.
Proceedings SPIE,vol. 4345, pp. 647-654.

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