Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface
Reexamination Certificate
2007-03-13
2007-03-13
Young, Christopher G. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Forming nonplanar surface
C430S313000, C430S315000, C430S322000, C430S330000, C427S271000, C427S372200, C427S384000, C427S385500, C438S760000
Reexamination Certificate
active
10602883
ABSTRACT:
It is disclosed a method of forming fine patterns comprising: covering a substrate having photoresist patterns with an over-coating agent for forming fine patterns, removing the unwanted over-coating agent that has been deposited on the edge portions and/or the back side of the substrate, applying heat treatment to cause thermal shrinkage of the over-coating agent so that the spacing between adjacent photoresist patterns is lessened by the resulting thermal shrinking action, and removing the over-coating agent substantially completely. The invention provides a method of forming fine patterns which has high ability to control pattern dimensions and provide fine patterns that have a satisfactory profile and satisfy the characteristics required of semiconductor devices, with an additional capability of preventing the occurrence of particles which are a potential cause of device contamination.
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“Extended Abstracts”, (The 42ndSpring Meeting, 1995);The Japan Society of Applied Physics and Related Societies,No. 2.
“Extended Abstracts”, (The 55thAutumn Meeting, 1994);The Japan Society of Applied Physics,No. 2.
Proceedings SPIE,vol. 4345, pp. 647-654.
Kaneko Fumitake
Sugeta Yoshiki
Tachikawa Toshikazu
Tokyo Ohka Kogyo Co. Ltd.
Wenderoth , Lind & Ponack, L.L.P.
Young Christopher G.
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