Method for testing embedded DRAM arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07073100

ABSTRACT:
A method and system for testing an embedded DRAM that includes DRAM blocks. The method including: generating a test data pattern in a processor based BIST system, for each DRAM block, performing a write of the test data pattern into the DRAM block, performing a pause for a predetermined period of time, and performing a read of a resulting data pattern from the DRAM block; where for each DRAM block, the write of the test data pattern into the DRAM block is performed before the pause, and the read of the resulting data pattern from each DRAM block is performed after the pause; where at least a portion of the pause of two or more of the DRAM blocks overlap in time; and for each DRAM block comparing the test data pattern to the resulting data pattern.

REFERENCES:
patent: 5471482 (1995-11-01), Byers et al.
patent: 5689466 (1997-11-01), Qureshi
patent: 5761213 (1998-06-01), Adams et al.
patent: 5961653 (1999-10-01), Kalter et al.
patent: 6034900 (2000-03-01), Shirley et al.
patent: 6064620 (2000-05-01), Mobley
patent: 6182257 (2001-01-01), Gillingham
patent: 6252806 (2001-06-01), Ellis et al.
patent: 6496947 (2002-12-01), Schwarz
patent: 2003/0128045 (2003-07-01), Ochi
patent: 0523973 (1993-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for testing embedded DRAM arrays does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for testing embedded DRAM arrays, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for testing embedded DRAM arrays will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3568238

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.