Method for producing a semiconductor device

Electric lamp and discharge devices: systems – Discharge device load with fluent material supply to the... – Plasma generating

Reexamination Certificate

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C315S111810, C118S7230IR

Reexamination Certificate

active

06873112

ABSTRACT:
The invention provides a method, for processing a substrate. The substrate is placed in a chamber, where the chamber comprises a substrate holder within the chamber and a dielectric window forming a side of the chamber. A gas is provided into the chamber. An antenna is used to generate an azimuthally symmetric electric field. A substantially azimuthally symmetric plasma is formed from the gas using the azimuthally symmetric electric field. A substantially uniform process rate is produced across a surface of a substrate.

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patent: 6302966 (2001-10-01), Bailey, III et al.
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patent: 0813227 (1997-12-01), None
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patent: 0145134 (2001-06-01), None
U.S. Appl. No. 09/440,794, entitled “Materials and Gas Chemistries for Processing Systems”, filed Nov. 15, 1999, Bailey et al.
U.S. Appl. No. 09/470,236, entitled “Plasma Processing System with Dynamic Gas Distribution Control”, filed Nov. 15, 1999, Bailey et al.
U.S. Appl. No. 09/977,569, entitled Method and Apparatus for Producing Uniform Process Rates, filed Oct. 12, 2001, Bailey et al.
International Search Report, date mailed Mar. 25, 2003.

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