Thick gate oxide transistor and electrostatic discharge...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S361000, C257S173000

Reexamination Certificate

active

06861711

ABSTRACT:
An electrostatic discharge (ESD) protection circuit that includes an transistor with a gate electrode isolated from the semiconductor substrate. The transistor can be an insulated gate bipolar transistor (IGBT) connected between an integrated circuit (IC) pad and ground. The IGBT includes a parasitic thyristor that latches when the voltage at the pad exceeds a threshold level and does not turn off until the charge at the pad is dissipated, thereby preventing electrostatic damage to the IC.

REFERENCES:
patent: 4109274 (1978-08-01), Belenkov et al.
patent: 4605980 (1986-08-01), Hartranft et al.
patent: 4745450 (1988-05-01), Hartranft et al.
patent: 4807080 (1989-02-01), Clark
patent: 5162888 (1992-11-01), Co et al.
patent: 5374844 (1994-12-01), Moyer
patent: 5424226 (1995-06-01), Vo et al.
patent: 5504444 (1996-04-01), Neugebauer
patent: 5528188 (1996-06-01), Au et al.
patent: 5537075 (1996-07-01), Miyazaki
patent: 5546038 (1996-08-01), Croft
patent: 5571737 (1996-11-01), Sheu et al.
patent: 5578860 (1996-11-01), Costa et al.
patent: 5602404 (1997-02-01), Chen et al.
patent: 5631793 (1997-05-01), Ker et al.
patent: 5753920 (1998-05-01), Buehler et al.
patent: 5844280 (1998-12-01), Kim
patent: 5870268 (1999-02-01), Lin et al.
patent: 5959488 (1999-09-01), Lin et al.
patent: 6013942 (2000-01-01), Soderbarg et al.
patent: 6064109 (2000-05-01), Blanchard et al.
patent: 6064249 (2000-05-01), Duvvury et al.
patent: 6097235 (2000-08-01), Hsu et al.
patent: 6194764 (2001-02-01), Gossner et al.
patent: 6225649 (2001-05-01), Minato
patent: 6320232 (2001-11-01), Gossner et al.
patent: 6414532 (2002-07-01), Su et al.
patent: 6437419 (2002-08-01), Bhalla et al.
patent: 6469560 (2002-10-01), Chang et al.
patent: 6507471 (2003-01-01), Colclaser et al.
patent: WO 9630936 (1996-10-01), None
Antinone, Robert J. et al., “Electrical Overstress Protection For Electronic Devices,” Noyes Publications, pp. 17-26.
Pendharkar, Sameer et al., “SCR-LDMOS—A Novel LDMOS Device With ESD Robustness,” 2000 IEEE, pp. 341-344.
Wang, Albert Z.H. et al., “An On-Chip ESD Protection Circuit with Low Trigger Voltage in BiCMOS Technology,” IEEE Journal of Solid-State Circuits, vol. 36, No. 1, Jan. 2001, pp. 40-45.
Antinone, Robert J. et al., “Electrical Overstress Protection For Electronic Devices,” Park Ridge, N.J., U.S.A.: Noyes Publications, 1986, pp. 17-26.
Iwamuro, N. et al., “Switching Loss Analysis Of Shorted Drain Non Punch-Through And Punch-Through Type IGBTS In Voltage Resonant Circuit,” 3rdInternational Symposium on Power Semiconductor Devices and ICS, ISPSD '91, Apr. 22-24, 1991, pp. 220-225.
Simpson, M. R. et al., “Analysis Of The Lateral Insulated Gate Transistor,” International Electron Devices meeting, Washington, D.C., Dec. 1-4, 1985, pp. 740-743.
Charvaka Duvvury et al. “Substrate Pump NMOS for ESD Protection Applications,” Silicon Technology Development, Texas Instruments, Dallas, Texas, 11 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thick gate oxide transistor and electrostatic discharge... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thick gate oxide transistor and electrostatic discharge..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thick gate oxide transistor and electrostatic discharge... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3415420

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.