Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-04-26
2009-12-22
Nguyen, Ha Tran T (Department: 2829)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S611000, C438S612000, C257S738000
Reexamination Certificate
active
07635643
ABSTRACT:
A method for forming preferably Pb-lead C4 connections or capture pads with ball limiting metallization on an integrated circuit chip by using a damascene process and preferably Cu metallization in the chip and in the ball limiting metallization for compatibility. In two one embodiment, the capture pad is formed in the top insulating layer and it also serves as the final level of metallization in the chip.
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Daubenspeck Timothy H.
Farooq Mukta G.
Gambino Jeffrey P.
Muzzy Christopher D.
Petrarca Kevin S.
Brown Edward W.
Brown Valerie
International Business Machines - Corporation
Nguyen Ha Tran T
Sabo William D.
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