Method for forming a capacitor for use in a semiconductor...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S396000, C257SE27086

Reexamination Certificate

active

07361547

ABSTRACT:
A method for forming a capacitor for use in a semiconductor device having electrode plugs surrounded by an insulating film and connected to underlying contact pads, includes sequentially forming an etch stop film and a mold oxide film on the insulating film and the electrode plugs, forming recesses in portions of the mold oxide film and the etching stopper film, the recesses exposing the electrode plugs, forming storage node electrodes in the recesses, filling the recesses in which the storage node electrodes are formed with an artificial oxide film, planarizing the storage node electrodes and the artificial oxide film so that the storage node electrodes are separated from one another, and selectively removing the mold oxide film and the artificial oxide film using a diluted hydrofluoric acid solution containing substantially no ammonium bifluoride.

REFERENCES:
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patent: 6156608 (2000-12-01), Chen
patent: 6184077 (2001-02-01), Shin et al.
patent: 6238968 (2001-05-01), Yu et al.
patent: 6528368 (2003-03-01), Park
patent: 6852781 (2005-02-01), Savu et al.
patent: 2001/0031556 (2001-10-01), Pas
patent: 2001/0039116 (2001-11-01), Takeshima et al.
patent: 2003/0071299 (2003-04-01), Ohno
patent: 2003/0178728 (2003-09-01), Park et al.
patent: 2004/0137680 (2004-07-01), Matsumura

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