Method for asymmetric spacer formation

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S302000, C438S303000, C438S305000

Reexamination Certificate

active

06794256

ABSTRACT:

FIELD OF THE DISCLOSURE
The present disclosure relates generally to a semiconductor manufacturing process, and more particularly to a method for formation of spacers in a semiconductor manufacturing process.
BACKGROUND
Asymmetric spacers are used for various functions during semiconductor device manufacturing. For example, if differential offsets are needed for disparate doping requirements of source or drain areas near a gate structure, oftentimes asymmetric spacers are utilized to accomplish this offset. A commonly employed technique for the formation of asymmetric spacers utilizes multiple gate structure sidewall insulator layers and multiple implantations with numerous photoresist masking and etching processes to produce the desired offset. This technique is time-consuming, and the multiple masking and etching steps add to the manufacturing costs accordingly.
Therefore, a method which overcomes these problems would be useful.


REFERENCES:
patent: 5510280 (1996-04-01), Noda
patent: 5639688 (1997-06-01), Delgado et al.
patent: 5789298 (1998-08-01), Gardner et al.
patent: 5893739 (1999-04-01), Kadosh et al.
patent: 5963809 (1999-10-01), Duane et al.
patent: 6104064 (2000-08-01), Kadosh et al.
patent: 6200863 (2001-03-01), Xiang et al.
patent: 6218250 (2001-04-01), Hause et al.
patent: 6403425 (2002-06-01), Ang et al.
patent: 6566204 (2003-05-01), Wang et al.

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