4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

S. Doug Ray

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Apparatus to evaluate hot carrier injection performance...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Device and method for programming a logic level within an integr

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Device and method for programming a logic level within an integr

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Device and method for programming a logic level within an interg

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Low power, slew rate insensitive power-on reset circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing
Patent

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Profile ID: LFUS-PAI-P-827395

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