4. Semiconductor device manufacturing: process
  5. With measuring or testing
  6. Optical characteristic sensed

Edward E. Ehrichs

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High emissivity capacitor structure

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed
Reexamination Certificate

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Method and apparatus for accurate alignment of integrated...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...
Reexamination Certificate

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Method for asymmetric spacer formation

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Method for automated determination of reticle tilt in a...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method for determining the damage potential of the different...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Utility Patent

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Profile ID: LFUS-PAI-P-1131701

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