Method and system for testing semiconductor memory device...

Details Method and system for testing semiconductor memory device... Method and system for testing semiconductor memory device...

2007-07-23

2010-10-26

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S192000, C365S201000, C714S005110, C714S700000, C714S707000, C714S721000, C714S731000, C714S744000

Reexamination Certificate

active

07823031

ABSTRACT:
Provided are a method and system for testing a semiconductor memory device using an internal clock signal of the semiconductor memory device as a data strobe signal. The internally-generated data strobe signal may be delayed to synchronize with test data. Because a test device need not supply the data strobe signal, the number of semiconductor memory modules that can be simultaneously tested can be increased, and an average test time for a unit memory module can be decreased.

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