Method and circuit using boundary scan cells for design...

Details Method and circuit using boundary scan cells for design... Method and circuit using boundary scan cells for design...

2007-10-09

2007-10-09

Louis-Jacques, Jacques (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000, C714S734000, C714S745000, C702S075000, C702S106000, C716S030000

Reexamination Certificate

active

10906481

ABSTRACT:
A boundary scan register circuit and a method of characterization testing. The boundary scan register circuit, including: a multiplicity of boundary scan cells connected in series, each boundary scan cell having a latch; means for isolating the boundary scan cells into one or more boundary scan segments, each boundary scan segment containing a different set of the boundary scan cells; and means for characterizing signal propagation through each boundary scan segment.

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