Manufacturing process of a semiconductor non-volatile memory...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257SE29264

Reexamination Certificate

active

10323615

ABSTRACT:
A process for manufacturing a non-volatile memory cell having at least one gate region, the process including the steps of depositing a first dielectric layer onto a semiconductor substrate; depositing a first semiconductor layer onto the first dielectric layer to form a floating gate region of the memory cell; and defining the floating gate region of the memory cell in the first semiconductor layer. The process further includes the step of depositing a second dielectric layer onto the first conductive layer, the second dielectric layer having a higher dielectric constant than 10. Also disclosed is a memory cell integrated in a semiconductor substrate and having a gate region that has a dielectric layer formed over a first conductive layer and having a dielectric constant higher than 10.

REFERENCES:
patent: 5349494 (1994-09-01), Ando
patent: 5897354 (1999-04-01), Kachelmeier
patent: 5907780 (1999-05-01), Gilmer et al.
patent: 5998264 (1999-12-01), Wu
patent: 6008091 (1999-12-01), Gregor et al.
patent: 6020243 (2000-02-01), Wallace et al.
patent: 6060406 (2000-05-01), Alers et al.
patent: 6060755 (2000-05-01), Ma et al.
patent: 6163049 (2000-12-01), Bui
patent: 6184072 (2001-02-01), Kaushik et al.
patent: 6362045 (2002-03-01), Lin et al.
patent: 6423619 (2002-07-01), Grant et al.
patent: 6531347 (2003-03-01), Huster et al.
patent: 6562491 (2003-05-01), Jeon
patent: 6677640 (2004-01-01), Sandhu et al.
patent: 6806145 (2004-10-01), Haukka et al.
patent: 6812514 (2004-11-01), Yang et al.
patent: 6844604 (2005-01-01), Lee et al.
patent: 2001/0044187 (2001-11-01), Joo et al.
patent: 2002/0137317 (2002-09-01), Kaushik et al.
patent: 2004/0121534 (2004-06-01), Lin et al.
patent: WO 00/77838 (2000-12-01), None

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