Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-07-15
2009-12-15
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S734000
Reexamination Certificate
active
07634702
ABSTRACT:
An integrated circuit apparatus including an improved test circuit and a method of testing the integrated circuit apparatus are provided. The integrated circuit apparatus determines pass or fail of the integrated circuit apparatus itself by comparing internal DQ data output by a core logic circuit with test patterns set by a mode register set (MRS) code or test patterns directly input from an external source.
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Kim Hong-beom
Song Yoon-gyu
Britt Cynthia
Mills & Onello LLP
Samsung Electronics Co,. Ltd.
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