4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Jayabrata Ghosh Dastidar

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Apparatus and method for encrypting security sensitive data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Area-efficient memory built-in-self-test circuitry with...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Automatic test configuration generation facilitating repair...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Automatic testing for programmable networks of control signals

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Constraint-driven test generation for programmable logic...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2348780

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