4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Chitomi Terayama

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Failure analysis device for IC tester and memory device measurin

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Integrated circuit tester

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1870999

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