4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Jonathan R. Fales

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Command multiplier for built-in-self-test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Efficient circuit and method to measure resistance thresholds

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Test structure and method for detecting and studying crystal...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3058622

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