Chemical vapor deposition of high quality flow-like silicon...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

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C438S787000, C438S788000

Reexamination Certificate

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07825038

ABSTRACT:
Methods of depositing a silicon oxide layer on a substrate are described. The methods may include the steps of providing a substrate to a deposition chamber, generating an atomic oxygen precursor outside the deposition chamber, and introducing the atomic oxygen precursor into the chamber. The methods may also include introducing a silicon precursor to the deposition chamber, where the silicon precursor and the atomic oxygen precursor are first mixed in the chamber. The silicon precursor and the atomic oxygen precursor react to form the silicon oxide layer on the substrate, and the deposited silicon oxide layer may be annealed. Systems to deposit a silicon oxide layer on a substrate are also described.

REFERENCES:
patent: 4147571 (1979-04-01), Stringfellow et al.
patent: 4816098 (1989-03-01), Davis et al.
patent: 4818326 (1989-04-01), Liu et al.
patent: 4931354 (1990-06-01), Wakino et al.
patent: 5016332 (1991-05-01), Reichelderfer et al.
patent: 5110407 (1992-05-01), Ono et al.
patent: 5393708 (1995-02-01), Hsia et al.
patent: 5426076 (1995-06-01), Moghadam
patent: 5558717 (1996-09-01), Zhao et al.
patent: 5587014 (1996-12-01), Iyechika et al.
patent: 5622784 (1997-04-01), Okaue et al.
patent: 5635409 (1997-06-01), Moslehi
patent: 5691009 (1997-11-01), Sandhu
patent: 5786263 (1998-07-01), Perera
patent: 5853607 (1998-12-01), Zhao et al.
patent: 5937308 (1999-08-01), Gardner et al.
patent: 5937323 (1999-08-01), Orczyk et al.
patent: 6008515 (1999-12-01), Hsia et al.
patent: 6009830 (2000-01-01), Li et al.
patent: 6024044 (2000-02-01), Law et al.
patent: 6087243 (2000-07-01), Wang
patent: 6090723 (2000-07-01), Thakur et al.
patent: 6140242 (2000-10-01), Oh et al.
patent: 6146970 (2000-11-01), Witek et al.
patent: 6156581 (2000-12-01), Vaudo et al.
patent: 6180490 (2001-01-01), Vassiliev et al.
patent: 6207587 (2001-03-01), Li et al.
patent: 6302964 (2001-10-01), Umotoy et al.
patent: 6383954 (2002-05-01), Wang et al.
patent: 6387207 (2002-05-01), Janakiraman et al.
patent: 6406677 (2002-06-01), Carter et al.
patent: 6448187 (2002-09-01), Yau et al.
patent: 6503557 (2003-01-01), Joret
patent: 6506253 (2003-01-01), Sakuma
patent: 6508879 (2003-01-01), Hashimoto
patent: 6509283 (2003-01-01), Thomas
patent: 6524931 (2003-02-01), Perera
patent: 6528332 (2003-03-01), Mahanpour et al.
patent: 6544900 (2003-04-01), Raaijmakers et al.
patent: 6548416 (2003-04-01), Han et al.
patent: 6566278 (2003-05-01), Harvey et al.
patent: 6596654 (2003-07-01), Bayman et al.
patent: 6614181 (2003-09-01), Harvey et al.
patent: 6630413 (2003-10-01), Todd
patent: 6660391 (2003-12-01), Rose et al.
patent: 6676751 (2004-01-01), Solomon et al.
patent: 6683364 (2004-01-01), Oh et al.
patent: 6716770 (2004-04-01), O'Neill et al.
patent: 6756085 (2004-06-01), Waldfried et al.
patent: 6787191 (2004-09-01), Hanahata et al.
patent: 6794290 (2004-09-01), Papasouliotis et al.
patent: 6818517 (2004-11-01), Maes
patent: 6830624 (2004-12-01), Janakiraman et al.
patent: 6833052 (2004-12-01), Li et al.
patent: 6833322 (2004-12-01), Anderson et al.
patent: 6867086 (2005-03-01), Chen et al.
patent: 6890403 (2005-05-01), Cheung et al.
patent: 6900067 (2005-05-01), Kobayashi et al.
patent: 6955836 (2005-10-01), Kumagi et al.
patent: 6958112 (2005-10-01), Karim et al.
patent: 7018902 (2006-03-01), Visokay et al.
patent: 7084076 (2006-08-01), Park et al.
patent: 7115419 (2006-10-01), Suzuki
patent: 7129185 (2006-10-01), Aoyama et al.
patent: 7148155 (2006-12-01), Tarafdar et al.
patent: 7205248 (2007-04-01), Li et al.
patent: 7220461 (2007-05-01), Hasebe et al.
patent: 7297608 (2007-11-01), Papasouliotis et al.
patent: 7399388 (2008-07-01), Moghadam et al.
patent: 7419903 (2008-09-01), Haukka et al.
patent: 7435661 (2008-10-01), Miller et al.
patent: 7498273 (2009-03-01), Mallick et al.
patent: 7524735 (2009-04-01), Gauri et al.
patent: 7541297 (2009-06-01), Mallick et al.
patent: 7745352 (2010-06-01), Mallick et al.
patent: 2001/0021595 (2001-09-01), Jang et al.
patent: 2001/0029114 (2001-10-01), Vulpio et al.
patent: 2001/0038919 (2001-11-01), Berry, III et al.
patent: 2001/0054387 (2001-12-01), Frankel et al.
patent: 2002/0048969 (2002-04-01), Suzuki et al.
patent: 2002/0081817 (2002-06-01), Bhakta et al.
patent: 2002/0127350 (2002-09-01), Ishikawa et al.
patent: 2002/0142585 (2002-10-01), Mandal
patent: 2002/0146879 (2002-10-01), Fu et al.
patent: 2002/0164891 (2002-11-01), Gates et al.
patent: 2003/0064154 (2003-04-01), Laxman et al.
patent: 2003/0118748 (2003-06-01), Kumagai et al.
patent: 2003/0124873 (2003-07-01), Xing et al.
patent: 2003/0143841 (2003-07-01), Yang et al.
patent: 2003/0159656 (2003-08-01), Tan et al.
patent: 2003/0172872 (2003-09-01), Thakur et al.
patent: 2003/0199151 (2003-10-01), Ho et al.
patent: 2003/0232495 (2003-12-01), Moghadam et al.
patent: 2004/0008334 (2004-01-01), Sreenivasan et al.
patent: 2004/0020601 (2004-02-01), Zhao et al.
patent: 2004/0048492 (2004-03-01), Ishikawa et al.
patent: 2004/0065253 (2004-04-01), Pois et al.
patent: 2004/0079118 (2004-04-01), M'Saad et al.
patent: 2004/0146661 (2004-07-01), Kapoor et al.
patent: 2004/0152342 (2004-08-01), Li et al.
patent: 2004/0161899 (2004-08-01), Luo et al.
patent: 2004/0175501 (2004-09-01), Lukas et al.
patent: 2004/0180557 (2004-09-01), Park et al.
patent: 2004/0185641 (2004-09-01), Tanabe et al.
patent: 2004/0219780 (2004-11-01), Ohuchi
patent: 2004/0241342 (2004-12-01), Karim et al.
patent: 2005/0001556 (2005-01-01), Hoffman et al.
patent: 2005/0019494 (2005-01-01), Moghadam et al.
patent: 2005/0026443 (2005-02-01), Goo et al.
patent: 2005/0062165 (2005-03-01), Saenger et al.
patent: 2005/0087140 (2005-04-01), Yuda et al.
patent: 2005/0142895 (2005-06-01), Ingle et al.
patent: 2005/0181555 (2005-08-01), Haukka et al.
patent: 2005/0186731 (2005-08-01), Derderian et al.
patent: 2005/0196533 (2005-09-01), Hasebe et al.
patent: 2005/0227499 (2005-10-01), Park et al.
patent: 2005/0250340 (2005-11-01), Chen et al.
patent: 2006/0011984 (2006-01-01), Curie
patent: 2006/0014399 (2006-01-01), Joe
patent: 2006/0030165 (2006-02-01), Ingle et al.
patent: 2006/0055004 (2006-03-01), Gates et al.
patent: 2006/0068599 (2006-03-01), Baek et al.
patent: 2006/0096540 (2006-05-01), Choi
patent: 2006/0110943 (2006-05-01), Swerts et al.
patent: 2006/0121394 (2006-06-01), Chi
patent: 2006/0162661 (2006-07-01), Jung et al.
patent: 2006/0178018 (2006-08-01), Olsen
patent: 2006/0223315 (2006-10-01), Yokota et al.
patent: 2006/0228903 (2006-10-01), McSwiney et al.
patent: 2006/0281496 (2006-12-01), Cedraeus
patent: 2006/0286776 (2006-12-01), Ranish et al.
patent: 2007/0020392 (2007-01-01), Kobrin et al.
patent: 2007/0026689 (2007-02-01), Nakata et al.
patent: 2007/0049044 (2007-03-01), Marsh
patent: 2007/0077777 (2007-04-01), Gumpher
patent: 2007/0092661 (2007-04-01), Ryuzaki et al.
patent: 2007/0128864 (2007-06-01), Ma et al.
patent: 2007/0173073 (2007-07-01), Weber
patent: 2007/0181966 (2007-08-01), Watatani et al.
patent: 2007/0232082 (2007-10-01), Balseanu et al.
patent: 2007/0281495 (2007-12-01), Mallick et al.
patent: 2007/0281496 (2007-12-01), Ingle et al.
patent: 2008/0085607 (2008-04-01), Yu et al.
patent: 2008/0102223 (2008-05-01), Wagner et al.
patent: 2009/0061647 (2009-03-01), Mallick et al.
patent: 19654737 (1997-07-01), None
patent: 1717848 (2006-11-01), None
patent: 01241826 (1989-09-01), None
patent: WO 02/077320 (2002-10-01), None
patent: WO 03/066933 (2003-08-01), None
patent: WO 2005/078784 (2005-08-01), None
patent: WO 2007/040856 (2007-04-01), None
patent: WO 2007/140376 (2007-12-01), None
patent: WO 2007/140424 (2007-12-01), None
G. Gulleri et al, “Deposition Temperature Determination of HDPCVD Silicon Dioxide Films”, 2005, Microelectronic Engineering, vol. 82, pp. 236-241.
Coltrin, M.E., et al., “Chemistry of AlGaN Particulate Formation,” National Nuclear Security Administration, Physical, Chemical, & Nano Sciences Center, Research Briefs, 2005, pp. 42-43.
Kang, Hun, “A Study of the Nucleation and Formation of Multi-functional Nanostructures using GaN-Based Materials for Device Applications,

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