Apparatus and method for testing on-chip ROM

Details Apparatus and method for testing on-chip ROM Apparatus and method for testing on-chip ROM

2006-11-07

2006-11-07

Lamarre, Guy (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C365S201000, C714S719000, C714S733000, C714S030000

Reexamination Certificate

active

07134063

ABSTRACT:
An apparatus for testing an on-chip ROM and a method thereof are provided. By embedding the on-chip ROM test apparatus in a semiconductor chip and externally providing only minimal information, the apparatus and the method can prevent the possible exposure of ROM data stored in the ROM. Also, according to the apparatus and method, information related to the ROM address at which an error occurred can be provided together with the test result and by feeding the ROM address information back to the manufacturing process, product yield can be improved.

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