Agent for forming coating for narrowing patterns and method...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S313000, C430S315000, C430S322000, C430S324000, C430S330000, C427S271000, C427S372200, C427S384000, C427S385500, C438S760000, C524S555000, C524S556000, C525S206000, C526S263000, C526S316000, C548S325500

Reexamination Certificate

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10471772

ABSTRACT:
It is disclosed an over-coating agent for forming fine patterns which is applied to cover a substrate having photoresist patterns thereon and allowed to shrink under heat so that the spacing between the adjacent photoresist patterns is lessened, further characterized by containing a water-soluble polymer and a surfactant. Also disclosed is a method of forming fine-line patterns using the over-coating agent. According to the invention, one can obtain fine-line patterns which exhibit good profiles while satisfying the characteristics required of semiconductor devices, being excellent in controlling the dimension of patterns.

REFERENCES:
patent: 5858620 (1999-01-01), Ishibashi et al.
patent: 6486058 (2002-11-01), Chun
patent: 64-023535 (1989-01-01), None
patent: 01-307228 (1989-12-01), None
patent: 04-364021 (1992-12-01), None
patent: 05-166717 (1993-07-01), None
patent: 05-241348 (1993-09-01), None
patent: 07-045510 (1995-02-01), None
patent: 10-073927 (1998-03-01), None
patent: 11-283910 (1999-10-01), None
patent: 2000-347414 (2000-12-01), None
patent: 2001-281886 (2001-01-01), None
patent: 01/00735 (2001-01-01), None

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