4. Optics: measuring and testing
  5. By light interference
  6. For dimensional measurement
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Nakauchi Akihiro

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Namkoong Whan

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Nano Or Technologies Inc.

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Narumi Tatsuya

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Nasr Magued B.

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Natividad Phil S.

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Natividao Phi

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Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk

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Neily Richard A.

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Nguyen Phillip

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Nierop John Van

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Nishikawa Tadayasu

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Nolte David

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Noska Brandon

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Novak Erik

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Novak Erik K.

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Nozu, legal representative Yuka

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