4. Optics: measuring and testing
  5. By light interference
  6. For dimensional measurement

David Nolte

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Enhanced photo-EMF sensor with high bandwidth and large...

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit
Reexamination Certificate

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Laser scanning interferometric surface metrology

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Laser scanning interferometric surface metrology

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2382860

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