4. Optics: measuring and testing
  5. By light interference
  6. For dimensional measurement
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Valyukh Sergiy

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Valyukh Sergiy

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Van Doren Matthew

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Van Empel Tjarko Adriaan Rudolf

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Vereniging Voor Christelijk Hoger Onderwijs Wetenschappelijk Ond

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Vignola Joseph F.

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Visher John L.

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Vistec Semiconductor Systems GmbH

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Voigtlaender Knut

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