4. Optics: measuring and testing
  5. By light interference
  6. For dimensional measurement

Richard A. Neily

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System and method for producing optical circuits

Optical waveguides – Integrated optical circuit
Reexamination Certificate

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System and method for producing optical circuits

Optical waveguides – Integrated optical circuit
Reexamination Certificate

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System of fabricating plane parallel substrates with uniform...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Technique for fabricating high quality optical components

Optics: measuring and testing – Dimension – Thickness
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Profile ID: LFUS-PAI-P-2649087

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