LandOfFree - US Patents - Listing for Optics: measuring and testing

Optics: measuring and testing – Miscellaneous

Visual prominence meter

Optics: measuring and testing – Range or remote distance finding – With photodetection

Visual recognition system for LADAR sensors

Optics: measuring and testing – By alignment in lateral direction – With light detector

Visual sensor coordinate system setting jig and setting method

Optics: measuring and testing – Range or remote distance finding – With photodetection

Visualization device

Optics: measuring and testing – By polarized light examination

Visualizing birefringent structures in samples

Optics: measuring and testing – By shade or color – With color transmitting filter

vivo monitoring method of transgenic plants and system using...

Optics: measuring and testing – By polarized light examination – With polariscopes

Voltage and electric field measuring device using light

Optics: measuring and testing – Photometers – Comparison

Voltage detecting circuit

Optics: measuring and testing – By polarized light examination – With light attenuation

Volume determination process

Optics: measuring and testing – Dimension – Volume

Volume measurement system and method for volume element...

Optics: measuring and testing – For optical fiber or waveguide inspection

Volume sensor for paddle elevator using laser light

Optics: measuring and testing – By polarized light examination – With light attenuation

Volume-measuring method for surface depressions

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer

Volumetric endoscopic coherence microscopy using a coherent...

Optics: measuring and testing – By polarized light examination – With light attenuation

Volumetric measurement of a parcel using a CCD line scanner and

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Volumetric measurement of particles

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

VUV Plasma atomic emission spectroscopic instrument and method

Optics: measuring and testing – By alignment in lateral direction – With light detector

Wafer alignment device

Optics: measuring and testing – By polarized light examination – With light attenuation

Wafer alignment sensor

Optics: measuring and testing – By alignment in lateral direction – With light detector

Wafer alignment sensor using a phase-shifted microlens array