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Method and apparatus for determining a property of a given subst

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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Method and apparatus for determining optical quality

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

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Method and apparatus for determining physical characteristics of

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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Method and apparatus for determining physical characteristics of

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
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Method and apparatus for determining physical characteristics of

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
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Method and apparatus for determining physical characteristics of

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Method and apparatus for determining presence of a component...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Method and apparatus for determining the mechanism responsible f

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

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Method and apparatus for determining the operational status of a

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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Method and apparatus for distinguishing between defects in an op

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Method and apparatus for distinguishing particles from...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Utility Patent

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Method and apparatus for embedded substrate and system...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Method and apparatus for evaluating semiconductor layers

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Method and apparatus for examining foreign matters in...

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Reexamination Certificate

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Method and apparatus for fluid propelled borescopes

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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Method and apparatus for handling and testing wafers

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Method and apparatus for high-resolution defect location and...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Method and apparatus for illuminating and imaging a can end coat

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

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Method and apparatus for illuminating material for automated...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

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Method and apparatus for imaging surface topography of a wafer

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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