Method and apparatus for examining foreign matters in...

Details Method and apparatus for examining foreign matters in... Method and apparatus for examining foreign matters in...

2005-06-14

2005-06-14

Nguyen, Tu T. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Having predetermined light transmission regions

Reexamination Certificate

active

06906795

ABSTRACT:
A method and an apparatus for examining foreign matters in through holes includes a light source provided on one side and a line sensor camera provided on the other sides, whereby the light source and sensor camera cooperate to inspect a work piece having a plurality of through holes. A parallel displacement system is provided to translate the work piece and the line sensor camera relative to each other to allow the line sensor camera to detect light passing through the plurality of through holes in one lot. An image processing device and determination device are also provided to determine whether foreign matters are present in the through holes based on deviations among receiving light regions corresponding to the respective through holes.

REFERENCES:
patent: 6360005 (2002-03-01), Aloni et al.
patent: 61-256237 (1986-11-01), None
U.S. Appl. No. 09/821,695, filed Mar. 29, 2001, Goto et al.
U.S. Appl. No. 09/821,816, filed Mar. 29, 2001, Goto et al.
Notification of Reasons of Rejection (in Chinese and Japanese).

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