4. Optics: measuring and testing
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System for simultaneously measuring thin film layer...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System, and mathematical regression-based method utilizing optic

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Systems and methods for measurement of a specimen with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Systems and methods for measurement of a specimen with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Systems and methods for measurement of a specimen with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Systems for measuring periodic structures

Optics: measuring and testing – By polarized light examination – Of surface reflection
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