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Apparatus for holographic interferometry suitable for inspection

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for measuring characteristics of optical angle

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Apparatus for measuring fine particles in liquid

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for measuring flow vectors in gas currents

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for measuring non-absorptive scattering

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for measuring particle fallout on a surface using a te

Optics: measuring and testing – By particle light scattering – With photocell detection
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Apparatus for measuring particle properties

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for measuring pulse width using two-photon absorption

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for measuring the total mass of particles suspended in

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for multiplexing fibre-optic sensing interferometers

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for optically analyzing an object using four-wave mixi

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for phase symmetrizing optical wave fronts

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for processing the frequency of a signal

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for reading a luminescence pattern of a sample

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for spectrometer alignment

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for the optical measurement of spectra distribution

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus for the simultaneous acquisition of high bandwidth inf

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus, system and method for determining wear of an article

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Apparatus/method for optical measuring a physical amount of a sp

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Appartatus and method for measuring a change in an energy path l

Optics: measuring and testing – By particle light scattering – With photocell detection
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