Apparatus for measuring particle properties

Details Apparatus for measuring particle properties Apparatus for measuring particle properties

1995-03-15

1996-11-05

Gonzalez, Frank

Optics: measuring and testing

By particle light scattering

With photocell detection

356343, 356455, 356 72, 356 73, 73580, G01N 2100

Patent

active

055723225

ABSTRACT:
An apparatus measures the diameter, relative concentration and weight of particles. The detection of scattered light produced when light is projected at particles drawn into a nozzle-shaped measuring space is used to measure particle diameter, particle concentration is measured based-on variations in the intensity of transmitted light, and particle weight is measured based on changes in operating frequency of a crystal oscillator resulting from the adhesion of particles on the surface of the crystal oscillator.

REFERENCES:
patent: 4896961 (1990-01-01), Ito
patent: 4928153 (1990-05-01), Glass
patent: 5296910 (1994-03-01), Cole
patent: 5481357 (1996-01-01), Alsan

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