Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1982-11-19
1985-09-17
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356353, 356354, G01B 902
Patent
active
045417202
ABSTRACT:
Interferometric devices wherein two beams (the object and reference beams) interfere are rendered insensitive to deformations in the ideally planar wave fronts of the two beams by making the deformations identical through optical phase mixing. For arrangements wherein the beams to be superposed upon each other are symmetrically guided, phase symmetrized output beams are formed from a common input beam by making the input beam perpendicularly incident upon a partially reflecting hypotenuse face of a roof prism or axicon. Rays positioned symmetrically with respect to the center plane of the prism or the center axis of the axicon become mixed because the portion of each reflected by the hypotenuse face becomes superposed with the transmitted portion of the other after total reflection inside the prism or axicon, yielding two output beams with a symmetrical phase distribution with respect to the center plane of the prism or the center axis of the axicon.
REFERENCES:
patent: 4167337 (1979-09-01), Jaerisch et al.
Sen et al., "Shearing Interferometers for Testing Corner Cubes and Right Angle Prisms", Applied Optics, vol. 5, No. 6, pp. 1009-1014, 6/66.
Ohtsuka, "Proposal for the Determination of the Complex Degree of Spatial Coherence", Optics Letters, vol. 1, No. 4, pp. 133-134, 10/77.
Carnevale et al., "Spatial Coherence Analysis by Interferometric Methods", Optica Acta, vol. 24, No. 11, pp. 1099-1104, 11/77.
Hausler Gerd
Jarisch Walter
Makosch Gunter
Drumheller Ronald L.
International Business Machines - Corporation
Koren Matthew W.
Willis Davis L.
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