Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1997-01-06
1998-05-19
Font, Frank G.
Optics: measuring and testing
By particle light scattering
With photocell detection
356352, G01B 902
Patent
active
057542937
ABSTRACT:
Apparatus comprising a source (1) of electromagnetic radiation; a sensing network (5) which comprises a plurality of sensing interferometers (10) each of which includes a wavelength filter for selecting a band of wavelengths (11) of electromagnetic radiation provided by the source (1) and is suitable for converting the magnitude of one or more physical parameters to a change in a sensor optical path length delay; a reference interferometer (7) for selecting a reference optical path delay; a wavelength selection device (8) for selecting one or more of the band of wavelengths (11) filtered by one or more of the sensing interferometers (10); and a detector (9) for converting the electromagnetic radiation selected by the wavelength selection device (8) to an electrical signal.
REFERENCES:
patent: 5361130 (1994-11-01), Kersey et al.
W.W. Morey, "Distributed Fiber Grating Sensors", Dec. 1990, pp. 285-288, United Technologies Research Center.
Font Frank G.
Kim Robert
Sensor Dynamics Limited
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