LandOfFree - US Patents - Listing for Optics: measuring and testing,By light interference,Having partially reflecting plates in series

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Tunable optical device using a scanning MEMS mirror

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Tunable optical instruments

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Tuning optical cavities

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Ultra small spot generator

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Using position-sensitive detectors for wavelength determination

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Variable spectroscopy device

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Vibration sensor utilizing a feedback stabilized fabry-perot...

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Wavelength monitoring device and method of tunable laser...

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Wavelength monitoring system

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Wavelength reference device

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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Wavemeter having two interference elements

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

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