Wavemeter having two interference elements

Details Wavemeter having two interference elements Wavemeter having two interference elements

2005-08-30

2005-08-30

Lee, Andrew H. (Department: 2877)

Optics: measuring and testing

By light interference

Having partially reflecting plates in series

Reexamination Certificate

active

06937346

ABSTRACT:
A wavemeter for determining a wavelength of an incident optical beam comprises four optical components, each being arranged in the incident optical beam or in a part of it, providing a path with a respective effective optical length, and generating a respective optical beam with a respective optical power depending on the wavelength of the incident optical beam. The optical powers oscillate periodically with increasing wavelength, and a phase shift of approximately pi/2 is provided between two respective pairs of the four optical components. Respective power detectors are provided, each detecting a respective one of the optical powers. A wavelength allocator is provided for allocating a wavelength to the incident optical beam based on the wavelength dependencies of the detected first, second, third, and fourth optical powers.

REFERENCES:
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patent: 6043883 (2000-03-01), Leckel et al.
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patent: 0 442 738 (1991-08-01), None
patent: 1 081 474 (2001-03-01), None
Clevorn, J., Examiner. European Search Report, Application No. EP 01 11 9892, dated Jan. 30, 2002.

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