Optics: measuring and testing – By light interference – Having partially reflecting plates in series
Reexamination Certificate
2007-12-18
2007-12-18
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
By light interference
Having partially reflecting plates in series
C356S454000
Reexamination Certificate
active
10922870
ABSTRACT:
A chip-size wavelength detector includes a film with laterally varying transmission properties and a position-sensitive detector. The film transmits a different wavelength as a function of lateral position across the film. The position of a spot of light transmitted through the film will shift, depending on the wavelength of the light. The shift is measured by the position-sensitive detector.
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Kiesel Peter
Schmidt Oliver
Wolst Oliver
Beran James T.
Leading-Edge Law Group, PLC
Palo Alto Research Center Incorporated
Turner Samuel A.
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